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Maximizing coating system longevity reduces total ownership costs to the US Navy fleet. Coating performance is directly tied to achieving proper film thickness control across the entire project surface. A novel concept of using digital camera/filters in synergy with MIL-PRF-23236 coating technology with enhanced optical properties provides unique inspection capabilities.
Maximizing coating system longevity reduces total ownership costs to the US Navy fleet. Coating performance is directly tied to achieving proper film thickness control across the entire project surface. A novel concept of using digital camera/filters in synergy with MIL-PRF-23236 coating technology with enhanced optical properties provides unique inspection capabilities. For example, 100% of a coated surface area can be inspected (versus current statistical approach taking intermittent readings). The feedback is visual and immediate. The work done at the Naval Research Lab (NRL) including the optics technology and concepts employed will be reviewed.
Over recent years there have been interesting developments in the way marine coatings and linings are specified that have unwittingly resulted in a situation that can make it challenging to meet a paint specification as currently written.
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The five-year review of D7091, Standard Practice for Non-destructive Measurement of Dry Film Thickness of Nonmagnetic Coatings Applied to Ferrous Metals and Nonmagnetic, Nonconductive Coatings Applied to Non-Ferrous Metals is due to be completed by the end of 2018. The main update to this standard practice is the addition of the concept of scanning probes. Scanning probes are configured to take reading continuously at a rate of more than two reading a second while the probe is in contact with the coating.
Dry film thickness (DFT) is an important parameter of coating application, and both low and high DFTs can result in coating failures. Typically, DFTs are measured in accordance with SSPC-PA 2, “Procedure for Determining Conformance to Dry Coating Thickness Requirements” (1), or other similar standards. Recent advancements in technology have resulted in DFT probes capable of achieving a higher rate of DFT data collection than previous devices.