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Statistical and Technical Evaluation of Rapid Dry Film Thickness (DFT) Measurement Technologies

Statistical and Technical Evaluation of Rapid Dry Film Thickness (DFT) Measurement Technologies
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Dry film thickness (DFT) is an important parameter of coating application, and both low and high DFTs can result in coating failures. Typically, DFTs are measured in accordance with SSPC-PA 2, “Procedure for Determining Conformance to Dry Coating Thickness Requirements” (1), or other similar standards. Recent advancements in technology have resulted in DFT probes capable of achieving a higher rate of DFT data collection than previous devices. 

Product Number: 51218-136-SG
Author: Jeff O'Dell
Publication Date: 2018
Industry: Coatings
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$20.00
$20.00

Dry film thickness (DFT) is an important parameter of coating application, and both low and high DFTs can result in coating failures. Typically, DFTs are measured in accordance with SSPC-PA 2, “Procedure for Determining Conformance to Dry Coating Thickness Requirements” (1), or other similar standards. Recent advancements in technology have resulted in DFT probes capable of achieving a higher rate of DFT data collection than previous devices. However, current standards do not take full advantage of the technology, and little is known of the effects of scanning probe wear on DFT accuracy and precision. In order to obtain higher confidence in DFT characterization of critically coated areas, a study has been completed to perform a statistical comparison of results obtained between the traditional non-scanning method and new scanning methods of DFT data collection. Results of this study have been used to develop recommendations for field implementation procedures to take full advantage of this technology

Dry film thickness (DFT) is an important parameter of coating application, and both low and high DFTs can result in coating failures. Typically, DFTs are measured in accordance with SSPC-PA 2, “Procedure for Determining Conformance to Dry Coating Thickness Requirements” (1), or other similar standards. Recent advancements in technology have resulted in DFT probes capable of achieving a higher rate of DFT data collection than previous devices. However, current standards do not take full advantage of the technology, and little is known of the effects of scanning probe wear on DFT accuracy and precision. In order to obtain higher confidence in DFT characterization of critically coated areas, a study has been completed to perform a statistical comparison of results obtained between the traditional non-scanning method and new scanning methods of DFT data collection. Results of this study have been used to develop recommendations for field implementation procedures to take full advantage of this technology

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