Different aqueous solutions were examined highlighting the corrosion potential of corrmaonly found metals and metal alloys present in computer components. Corrosion as a function of pH is identified and optimized for Cu, CoFe, and NiMn Ion Beam Deposited (IBD) films by Tafel plots. References to early computer field failures are presented that spotlight galvanic corrosion as a substantial cause for failed components. Further corrosion evaluation identifies galvanic corrosion
effects between combinations of NiFe, NiMn, Cu, CoFe, and Ru films where corrosion currents range from 20 to over 100..
Key words: Galvanic corrosion, atmospheric corrosion, computers, electrical connectors, circuit boards, salt spray, short circuits, Electromotive Series, F-16, potentiodynamic, Tafel plot, Cobalt (Co), Manganese (Mn), Iron (Fe), Ruthenium (Ru), Lead (Pb), Copper (Cu), Gold (Au), Tantalum (Ta), amphoteric metals, acid, pH 2, pH 9, base, pH 13, electronics, giant magnetoresistive films, GMR